Fluke MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 712: (1 year) CAL VER /5500,3458 DATE: 02-Feb-98 AUTHOR: Fluke Corporation REVISION: $Revision: 1.1 $ ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 10 NUMBER OF LINES: 103 CONFIGURATION: Fluke 5500A CONFIGURATION: HP 3458A ============================================================================= # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # Source: # Fluke 712 Cal & Verification Test Information # Sheet dated October 31,1997. # # Compatibility: # MET/CAL 5.0 or later # # Subprocedures: # None # # Required Files: # 55_712.bmp # 58_712.bmp # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R N P F W 1.002 ASK+ K X 1.003 HEAD PRELIMINARY INSTRUCTIONS AND EQUIPMENT SET-UP 1.004 DISP Ensure that the UUT has been allowed to stabilize 1.004 DISP in an environment with an ambient temperature of 1.004 DISP 18 to 28degC and relative humidity of less than 90%. 1.005 HEAD {RESISTANCE MEASUREMENT MODE TEST} 1.006 HEAD RESISTANCE MEASUREMENT MODE TEST 1.007 PIC 55_712 1.008 DISP Turn(POWER ON) to the UUT. 1.009 DISP Press (RTD TYPE) key until "TYPE R" is displayed. 1.009 DISP Press the (INPUT/OUTPUT key and the LARGE UP and 1.009 DISP DOWN ARROWS until the UUT indicates INPUT TYPE R 4W. 1.010 RSLT = The following (2) tests use a guardbanding technique 1.011 RSLT = to maintain the same Consumer Risk as a 4:1 TUR. 1.012 RSLT = 1.013 5500 207.5Z 0.1U 2W #! WARNING: Test Tol 0.1, Sys Tol 0.029525, TUR 3.3870 (< 4.00). # The preceding test limit is calculated to be 0.099U when reduced using the # method of reducing test uncertainties as described in "How to Maintain # Your Confidence in a World of Declining Test Uncertainty Ratios", Deaver, # David K., National Conference of Standard Laboratories Workshop and # Symposium, July 26,1993. 2.001 5500 950.0Z 0.5U 2W #! WARNING: Test Tol 0.5, Sys Tol 0.1265, TUR 3.9526 (< 4.00). # The preceding test limit is calculated to be 0.4975U when reduced using the # method of reducing test uncertainties as described in "How to Maintain # Your Confidence in a World of Declining Test Uncertainty Ratios", Deaver, # David K., National Conference of Standard Laboratories Workshop and # Symposium, July 26,1993. 3.001 5500 2350.0Z 1.0U 2W 4.001 5500 * S 4.002 DISP Disconnect all TEST LEADS. 4.003 DISP Press the INPUT/OUTPUT key to 4.003 DISP select OUTPUT TYPE R. 4.004 HEAD {RESISTANCE SOURCE MODE TEST} 4.005 HEAD RESISTANCE SOURCE MODE TEST 4.006 PIC 58_712 4.007 DISP [32] Set the UUT to OUTPUT 207.5 Ohms. 4.008 M3458 RNGLK 1kZ 4.009 3458 207.5Z 0.1U O 4W 5.001 M3458 RNGLK 10kZ 5.002 DISP [32] Set the UUT to OUTPUT 950 Ohms. 5.003 3458 950.0Z 0.5U O 4W 6.001 DISP [32] Set the UUT to OUTPUT 2350.0 Ohms. 6.002 3458 2350.0Z 1.0U O 4W 7.001 M3458 * 7.002 HEAD {KEYPAD TEST} 7.003 DISP Using the LARGE (DOWN) scroll key,scroll down to 7.003 DISP source 950.0 Ohms output. 7.004 MESS Using the SMALL (UP) scroll key verify the diplay 7.004 MESS scrolls in increments of .001, the .01 and finally .1. 7.005 MATH MEM2 = "Did the display scroll up?" 7.006 EVAL -s MEM2:Did UUT display scroll up in values of(.001,.01,.1)? 8.001 MESS Using the small (DOWN) scroll key verify the diplay 8.001 MESS scrolls in increments of .001, the .01 and finally .1. 8.002 MATH MEM2 = "Did the display scroll down?" 8.003 EVAL -s MEM2:Did UUT display scroll down in values of(.001,.01,.1)? 9.001 HEAD {LCD DISPLAY TEST} 9.002 DISP PRESS and HOLD the (INPUT/OUTPUT) key. 9.002 DISP TURN ON the UUT and release the (GREEN) 9.002 DISP POWER KEY. All LCD segments will stay on 9.002 DISP while the (INPUT/OUTPUT) key is depressed. 9.003 MESS Observe the UUT LCD Display. 9.004 MATH MEM2 = "Are all LCD Segments displayed?" 9.005 EVAL -s MEM2:Are all LCD Segments displayed? 10.001 END #! T.U.R.s less than 4.00: 2 #! T.U.R.s estimated using RANGE value: 0 #! T.U.R.s not calculated (ASK- U): 0 #! T.U.R.s not computable at compile time: 0 #! FOR JUSTIFICATION REFER TO COMMENTS FOLLOWING EACH TEST IN THIS LISTING.